Auger sputter depth profiling analysis of Ni/Cr multilayer thin film.
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: BUNSEKI KAGAKU
سال: 1992
ISSN: 0525-1931
DOI: 10.2116/bunsekikagaku.41.12_t157